Materials Characterization Core (MCC)

Overview

ORNL's Materials Characterization Core (MCC) provides accessibility, utilization, and fiscal sustainability to advanced characterization instruments. The MCC seeks to provide resources to ORNL's research community, encourage new collaborations, promote utilization, and support operational costs.  The MCC's software platform "iLab" includes an access-controlled reservation system and optional cost-recovery mechanisms.  Any ORNL employee can schedule available instrumentation through the MCC.

Core Instruments

Microscopy

  • Hitachi S3400N - SEM EDS - Variable Pressure (Non-Conductive Samples)
  • Hitachi S4800 - FE-SEM EDS BSE-YAG
  • TESCAN MIRA3 - FE-SEM EDS EBSD
  • Hitachi NB5000 - FIB SEM EDS
  • JEOL 2200FS-AC
  • JEOL 8200X EPMA - SEM EDS WDS X-ray Mapping
  • Nion MAC STEM - Monochromated Aberration Corrected Sub-Angstrom Probe
  • Scienta Omicron SPM - Low Temperature 4-probe STM AFM
  • ThermoFisher Scientific Talos L120C Cryo - FE-STEM - 120kV
  • ThermoFisher Scientific Titan Krios G4 Cryo - STEM EELS

Sample Preparation

  • Materialography Lab - Professional Sample Preparation
    • Montage/Mosaic Optical Imaging
    • Automated Micro-Hardness Testing
  • Materialography User Lab – Sample Coatings and Polishing
    • Coaters: Carbon, Miscellaneous, and Gold
    • Hot Mount System
    • Polishing Tables, Polishing Machines
    • Zeiss Optical Microscope (camera, polarization, interference contrast)

Spectroscopy

  • Avance III 400MHz Spectrometer – NMR
  • FTIR – Nicolet iS50 Advanced Flex Gold
  • HORIBA Scientific - Glow Discharge Optical Emission Spectrometer - GD-OES
  • ThermoFisher Scientific iCAP 7400 ICP-OES with ESI autosampler
  • ION NCS - SPM - AFM FIB ToF SIMS

X-Ray

  • Dual SAXS/WAXS
  • Malvern-PANalytical MRD 4 Axis
  • PANalytical High Temperature X-Ray Diffractometer - XRD
  • PANalytical Room Temperature X-Ray Diffractometer - XRD
  • Zeiss Xradia Versa 520

ThermoPhysics

  • Netzsch Differential Scanning Calorimeter - DSC
  • Netzsch Dilatometer 402 (SiC furnace <1600oC, Graphite Furnace <2400oC)
  • Netzsch LFA457 Microflash - Laser Flash Thermal Diffusivity System
  • Netzsch Simultaneous Thermal Analyzer - STA

Some Key Features

  • Instrument Schedule - Web-based schedule, viewable following MCC registration.  Custodian authorized users can schedule.  Users recieve an email after scheduling with an .ics file to add to outlook calendar.

  • Cost Recovery Option - User information (charge account) entered during scheduling.  Costs are distributed in proportion to the time used.

  • VOLUNTARY Participation - Does not affect "ownership" (e.g. location, staffing...). 

  • Instruments Configured for Specific Usage Types - The PI/program sets the fraction of time available to users or designated operators:

    • Self Use - open to trained/authorized users

    • Service Work - not open to users, only trained staff operate the instrument, possibly on the behalf of a user

    • CNMS User Program

Cost Recovery

An optional hourly instrument service charge, set by ORNL finance, is determined by the annual costs divided by the number of hours scheduled.  The projected rate aims to break-even for the year.  Annual operating costs could include:  Service contracts*, maintenance, time for staff to perform upkeep and oversight**, special utility or service charges, materials, consumables, etc.

*Service centers are burdened at ~38% compared to typical ~14% overhead. If the owner/program operates the instrument >~70% of the available time, cost recovery is not recommended.  However, users participating in cost recovery have an accounting "record of use" to support future equipment funding requests for repairs, replacement, or additions.
**Other services, such as specimen preparation, training by staff, designated operators time, etc. are NOT included in the instrument hourly rate. 

Please contact the MCC staff if your have further questions.

MCC Acknowledgement

All research results and publications from the instrumentation procured with Institutional funds (e.g. TESCAN, TOF-SIMS, MAC-STEM, 4-Probe, and Zeiss X-ray Tomography), must acknowledge Materials Characterization Core with the following statement: “This research was conducted, in part, using instrumentation within ORNL's Materials Characterization Core provided by UT-Battelle, LLC under Contract No. DE-AC05-00OR22725 with the U.S. Department of Energy.

Instruments purchased by ORNL with Institutional funds (e.g., IGPE funds) will be available to staff at ORNL ~70% of the time through either trained users or through designated operators. The remaining 30% of the time (and costs) are divided: 20% technical champion/custodian, 10% maintenance. 

Register for an iLab Account:

Please click HERE to fill out the required information and request an account. 

Core Staff

Jason Smith   Coordinator/Custodian          865-341-2183  smithjk@ornl.gov   Bldg. 4500S Rm. A252 

Laura Bailie   MCC Adminstrative Support   865-341-2085  bailiel@ornl.gov      Bldg. 4515 Rm. 117 

Links and Resources

  1. ORNL Home Page

  2. CNMS User Program